Evaluation of acceleration test for degradation of each layer in stacked amorphous silicon solar cell

被引：0
|
作者：
Kojima, T
机构：
[1] 1-1-4 Umezono Tsukuba-shi
来源：
ELECTRONICS LETTERS | 1999年 / 35卷 / 23期
关键词：
D O I：
10.1049/el:19991351
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The results of an evaluation of the degradation of each separate level and their subsequent recovery process for solar cells made of a three-layer stacked structure are presented. The spectral sensitivity characteristic and conversion efficiency are used as evaluation parameters. The results indicate that the degradation pattern for the bottom layer should be chosen as the standard as far as the evaluation of the overall conversion efficiency is concerned. This is because the absolute value of spectral sensitivity for the bottom layer is the smallest.
引用
收藏
页码：2057 / 2058
页数：2
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