Image difference metrics for high-resolution electron microscopy

被引：3
作者：
Ederer, Manuel [1 ]
Loeffler, Stefan [1 ]
机构：
[1] TU Wien, Univ Serv Ctr Transmiss Electron Microscopy, Wiedner Hauptstr 8-10-E057-02, A-1040 Vienna, Austria
来源：
ULTRAMICROSCOPY | 2022年 / 240卷
基金：
奥地利科学基金会;
关键词：
Image difference metric; Transmission electron microscopy; High-resolution; SIFT; SSIM; MSE; DAMAGE; MOS2;
D O I：
10.1016/j.ultramic.2022.113578
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Digital image comparison and matching brings many advantages over the traditional subjective human comparison, including speed and reproducibility. Despite the existence of an abundance of image difference metrics, most of them are not suited for high-resolution transmission electron microscopy (HRTEM) images. In this work we adopt two image difference metrics not widely used for TEM images. We compare them to subjective evaluation and to the mean squared error in regards to their behaviour regarding image noise pollution. Finally, the methods are applied to and tested by the task of determining precipitate sizes of a model material.
引用
收藏
页数：8
相关论文
共 47 条
  • [31] Pedersen M., 2009, Survey of full-reference image qualitymetrics
  • [32] Pfeiffer S., 2020, THESIS TU WIEN
  • [33] Rosenauer A, 1996, OPTIK, V102, P63
  • [34] FLUX PINNING CENTERS IN SUPERCONDUCTING NB3SN
    SCANLAN, RM
    FIETZ, WA
    KOCH, EF
    [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (05) : 2244 - 2249
  • [35] Sub-nanometer free electrons with topological charge
    Schattschneider, P.
    Stoeger-Pollach, M.
    Loeffler, S.
    Steiger-Thirsfeld, A.
    Hell, J.
    Verbeeck, J.
    [J]. ULTRAMICROSCOPY, 2012, 115 : 21 - 25
  • [36] Schoerling D, 2019, PART ACCEL DETECT, P1, DOI 10.1007/978-3-030-16118-7
  • [37] A new quantitative approach for microstructural analysis of coal char using HRTEM images
    Sharma, A
    Kyotani, T
    Tomita, A
    [J]. FUEL, 1999, 78 (10) : 1203 - 1212
  • [38] CALCULATION, DISPLAY AND COMPARISON OF ELECTRON-MICROSCOPE IMAGES MODELED AND OBSERVED
    SMITH, AR
    EYRING, L
    [J]. ULTRAMICROSCOPY, 1982, 8 (1-2) : 65 - 78
  • [39] Atomistic Description of Electron Beam Damage in Nitrogen-Doped Graphene and Single-Walled Carbon Nanotubes (vol 6, pg 8837, 2012)
    Susi, Toma
    Kotakoski, Jani
    Arenal, Raul
    Kurasch, Simon
    Jiang, Hua
    Skakalova, Viera
    Stephan, Odile
    Krasheninnikov, Arkady V.
    Kauppinen, Esko I.
    Kaiser, Ute
    Meyer, Jannik C.
    [J]. ACS NANO, 2013, 7 (08) : 7436 - 7436
  • [40] Radiolysis to knock-on damage transition in zeolites under electron beam irradiation
    Ugurlu, O.
    Haus, J.
    Gunawan, A. A.
    Thomas, M. G.
    Maheshwari, S.
    Tsapatsis, M.
    Mkhoyan, K. A.
    [J]. PHYSICAL REVIEW B, 2011, 83 (11)
12345