Image difference metrics for high-resolution electron microscopy

被引：3
作者：
Ederer, Manuel [1 ]
Loeffler, Stefan [1 ]
机构：
[1] TU Wien, Univ Serv Ctr Transmiss Electron Microscopy, Wiedner Hauptstr 8-10-E057-02, A-1040 Vienna, Austria
来源：
ULTRAMICROSCOPY | 2022年 / 240卷
基金：
奥地利科学基金会;
关键词：
Image difference metric; Transmission electron microscopy; High-resolution; SIFT; SSIM; MSE; DAMAGE; MOS2;
D O I：
10.1016/j.ultramic.2022.113578
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Digital image comparison and matching brings many advantages over the traditional subjective human comparison, including speed and reproducibility. Despite the existence of an abundance of image difference metrics, most of them are not suited for high-resolution transmission electron microscopy (HRTEM) images. In this work we adopt two image difference metrics not widely used for TEM images. We compare them to subjective evaluation and to the mean squared error in regards to their behaviour regarding image noise pollution. Finally, the methods are applied to and tested by the task of determining precipitate sizes of a model material.
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页数：8
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