High coupling piezoelectric thin films of Pb(Zr,Ti)O3-based ternary perovskite compounds for GHz-range film bulk acoustic resonators

被引:23
作者
Yamauchi, N. [1 ]
Shirai, T. [1 ]
Yoshihara, T. [1 ]
Hayasaki, Y. [1 ]
Ueda, T. [1 ]
Matsushima, T. [1 ]
Wasa, K. [2 ]
Kanno, I. [2 ]
Kotera, H. [2 ]
机构
[1] Panason Elect Works Co Ltd, Adv Technol Dev Lab, Osaka 5818686, Japan
[2] Kyoto Univ, Dept Micro Engn, Sakyo Ku, Kyoto 6068501, Japan
基金
日本科学技术振兴机构;
关键词
acoustic resonators; bulk acoustic wave devices; micromechanical resonators; piezoelectric thin films; sputtered coatings;
D O I
10.1063/1.3126060
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have deposited nearly stress-free single-crystal thin films of (001) Pb(Mn,Nb)O-3-Pb(Zr,Ti)O-3 (PMnN-PZT) on (001)MgO substrates by rf-magnetron sputtering using a quenching process after the film growth. It is found that single c-domain/single-crystal thin films of PMnN-PZT containing 5%-10% PMnN show a strong hard ferroelectric response with 2E(c)congruent to 400 kV/cm and P-s congruent to 70 mu C/cm(2). GHz-range film bulk acoustic resonators incorporating PMnN-PZT thin films have been fabricated with microelectromechanical system technology. The maximum electromechanical coupling coefficient k(t) and mechanical quality factor Q(m) were 0.7 and 185 in the 4 GHz range, respectively.
引用
收藏
页数:3
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