Negative Capacitance FinFET With Sub-20-mV/decade Subthreshold Slope and Minimal Hysteresis of 0.48 V

被引:109
作者
Ko, Eunah [1 ]
Lee, Jae Woo [2 ,3 ]
Shin, Changhwan [1 ]
机构
[1] Univ Seoul, Dept Elect & Comp Engn, Seoul 02504, South Korea
[2] Korea Univ, ICT Convergence Technol Hlth & Safety, Seoul 30019, South Korea
[3] Korea Univ, Dept Elect & Informat Engn, Seoul 30019, South Korea
基金
新加坡国家研究基金会;
关键词
Steep switching; negative capacitance FinFET; ferroelectric capacitor; S/D extension length (L-ext);
D O I
10.1109/LED.2017.2672967
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this letter, an n-type short-channel negative capacitance FinFET (NC-FinFET) with a hysteresis window of 0.48 V, an on-/off-current ratio of 10(7), and a sub20- mV/decade average subthreshold slope (SSavg) that is intended to overcome the Boltzmann limit (i. e., the physical limit in the SS, which is 60 mV/decade at 300 K), is experimentally demonstrated vs. a baseline FinFET with an SSavg of similar to 105 mV/decade. In our testing, we confirmed that the large hysteresis window in a short-channel NC-FinFET can be suppressed by using an appropriate source/drain extension length (L-ext). As Lext in the NC-FinFET is increased, the gate-to-source/drain capacitance (C-GS/C-GD) decreased and the hysteresis window narrows.
引用
收藏
页码:418 / 421
页数:4
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