Ultrafast nonlinear optical response of photoexcited Ge/SiGe quantum wells: Evidence for a femtosecond transient population inversion

被引:72
作者
Lange, C. [1 ,2 ]
Koester, N. S. [1 ,2 ]
Chatterjee, S. [1 ,2 ]
Sigg, H. [3 ]
Chrastina, D. [4 ,5 ]
Isella, G. [4 ,5 ]
von Kaenel, H. [4 ,5 ]
Schaefer, M. [6 ]
Kira, M. [6 ]
Koch, S. W. [6 ]
机构
[1] Univ Marburg, Fac Phys, D-35032 Marburg, Germany
[2] Univ Marburg, Ctr Mat Sci, D-35032 Marburg, Germany
[3] Paul Scherrer Inst, Lab Micro & Nanotechnol, CH-5232 Villigen, Switzerland
[4] CNISM, Dipartimento Fis, Politecn Milan, I-22100 Como, Italy
[5] Polo Como, L NESS, I-22100 Como, Italy
[6] Univ Marburg, Dept Phys & Mat Sci, D-35032 Marburg, Germany
来源
PHYSICAL REVIEW B | 2009年 / 79卷 / 20期
关键词
carrier relaxation time; charge injection; elemental semiconductors; germanium; high-speed optical techniques; many-body problems; nonlinear optics; photoexcitation; semiconductor quantum wells; silicon; silicon compounds; time resolved spectra; FREE-CARRIER ABSORPTION; SCATTERING; GAAS; GE;
D O I
10.1103/PhysRevB.79.201306
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Femtosecond time-resolved pump-probe spectroscopy is used to investigate the ultrafast carrier dynamics of Ge/SiGe quantum wells grown on a Si substrate. Pronounced nonequilibrium effects in the relaxation dynamics of the optically injected carrier distributions are observed and analyzed using a microscopic many-body theory. Transient population inversion and optical gain is obtained on a femtosecond time scale for excitation at energies slightly above the lowest direct quantum-well transition.
引用
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页数:4
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