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Multiferroic Bismuth Ferrite Based Thin Films
被引:0
|作者:
Yesner, G.
[1
]
Safari, A.
[1
]
机构:
[1] Rutgers State Univ, Dept Mat Sci & Engn, Piscataway, NJ 08854 USA
关键词:
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Bismuth ferrite thin films have been prepared via a modified polymerizable complex sol-gel method and deposited on SiO2/Si[100] substrates. The rhombohedral BFO phase was obtained by annealing the thin films on a hot plate at 475 degrees C for 30 minutes. Samples annealed at 550 degrees C for 2 hours developed the secondary phase Bi2Fe4O9 due to loss of bismuth.
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页码:122 / 123
页数:2
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