A Low-Power Single-Slope Analog-to-Digital Converter with Digital PVT Calibration

被引:0
作者
Osaki, Yuji [1 ]
Hirose, Tetsuya [1 ]
Tsubaki, Keishi [1 ]
Kuroki, Nobutaka [1 ]
Numa, Masahiro [1 ]
机构
[1] Kobe Univ, Dept Elect & Elect Engn, Nada Ku, 1-1 Rokkodai, Kobe, Hyogo 6578501, Japan
来源
2012 19TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS (ICECS) | 2012年
关键词
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A low-power single-slope analog-to-digital converter (SS ADC) is presented that uses an ultra-low-power reference current to achieve nano-watt power dissipation and a digital calibration function to compensate for the effect of process, voltage and temperature (PVT) variations. It converts two analog reference voltages into digital reference codes before it converts the input voltage into an input digital code. The SS ADC is tolerant to PVT variations due to the processing of the input digital code and two reference codes in the digital domain. A prototype was fabricated in the 180 nm CMOS process. Measurements demonstrated that it achieved a signal-to-noise- and-distortion ratio of 40.8 dB and an effective number of bits of 6.49 at a sampling rate of 800 S/s. It dissipated 174 nW in analog power and 36.5 nW in digital power, corresponding to the figure of merit for the 293 pJ/conversion-step.
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页码:613 / 616
页数:4
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