Applications of Integrated Near-field Antennas for Diagnosis of Electromagnetic Noises in Hybrid Electronic Architectures

被引:0
作者
Dienot, Jean-Marc [1 ,2 ]
机构
[1] Lab Genie Prod, F-65000 Tarbes, France
[2] Univ P Sabatier, Labceem, F-65000 Tarbes, France
来源
2013 IEEE 11TH INTERNATIONAL WORKSHOP OF ELECTRONICS, CONTROL, MEASUREMENT, SIGNALS AND THEIR APPLICATION TO MECHATRONICS (ECMSM) | 2013年
关键词
electromagnetic; near-field; probe; switching noise; electronic devices;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In modern electronic devices, increase of switching performances and integration design with new techniques and material make the compliances with the internal and external radiated behavior more and more critical. This paper present a synthetic state of challenging works to deal with this constraint. Different techniques and prototypes have been studied and developed to integrate electromagnetic sensors and probes in hybrid technology circuits. A good realistic and real-time evaluation of electromagnetic activity of these circuits should help for EMC background and designing, but also should be convenient to optimize the electromagnetic behavior during the real activity of the electronics.
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页数:6
相关论文
共 14 条
  • [1] [Anonymous], 2005, C9512005 IEEE, DOI [DOI 10.1109/IEEESTD.2006.99501, 10.1109/IEEESTD.2006.99501]
  • [2] Batista E., 2008, IEEE INT S EL COMP D
  • [3] Introduction to Near-Field techniques for EMC applications: State of the art and prospectives
    Bolomey, JC
    [J]. 2001 IEEE EMC INTERNATIONAL SYMPOSIUM, VOLS 1 AND 2, 2001, : 356 - 356
  • [4] Characterization off electromagnetic fields close to microwave devices using electric dipole probes
    Bouchelouk, Lakhdar
    Riah, Zouheir
    Baudry, David
    Kadi, Moncef
    Louis, Anne
    Mazari, Belahcene
    [J]. INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, 2008, 18 (02) : 146 - 156
  • [5] Electromagnetic Compatibility (EMC), 1995, 61000045 EMC EN
  • [6] Near-field magnetic measurements and their application to EMC of digital equipment
    Harada, T
    Masuda, N
    Yamaguchi, M
    [J]. IEICE TRANSACTIONS ON ELECTRONICS, 2006, E89C (01): : 9 - 15
  • [7] Ishii M., 2004, 2004 Conference on Precision electromagnetic Digest (IEEE Cat. No. 04CH37570), P80, DOI 10.1109/CPEM.2004.305450
  • [8] STANDARD PROBES FOR ELECTROMAGNETIC-FIELD MEASUREMENTS
    KANDA, M
    [J]. IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 1993, 41 (10) : 1349 - 1364
  • [9] Lourdel G., 2004, P IEEE INT S EL COMP, V2, P353
  • [10] Lourdel G., 2005, LOURDEL G