Form birefringence of oxidized porous silicon

被引：12

作者：

Golovan, L. A. ^{[1
]}

Ivanov, D. A.

Melnikov, V. A.

Timoshenko, V. Yu.

Zheltikov, A. M.

Kashkarov, P. K.

Petrov, G. I.

Yakovlev, V. V.

机构：

[1] Moscow MV Lomonosov State Univ, Phys Dept, Moscow 119992, Russia

[2] Univ Wisconsin, Dept Phys, Milwaukee, WI 53211 USA

来源：

APPLIED PHYSICS LETTERS | 2006年 / 88卷 / 24期

基金：

美国国家科学基金会; 俄罗斯基础研究基金会;

关键词：

D O I：

10.1063/1.2212534

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A network of preferentially oriented pores is shown to induce anisotropy of linear and nonlinear optical properties of oxidized porous silicon (OPS) films. Although the x-ray diffraction indicates the presence of amorphous phase in OPS samples, the near-infrared and visible transmission measurements reveal a strong in-plane anisotropy exceeding that for the crystalline quartz. This anisotropy modifies dramatically polarization properties of the nonlinear optical properties resulting in a strong anisotropy of the third-harmonic signal generated from these films.

引用

页数：3

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