Thermoelectric Power-Generation Characteristics of a Thin-Film Device Processed by the Flip-Chip Bonding of Bi2Te3 and Sb2Te3 Thin-Film Legs Using an Anisotropic Conductive Adhesive

被引:1
作者
Shin, Kang-Je [1 ]
Oh, Tae-Sung [1 ]
机构
[1] Hongik Univ, Dept Mat Sci & Engn, Seoul 121791, South Korea
基金
新加坡国家研究基金会;
关键词
thermoelectric device; thin film; bismuth telluride; antimony telluride; electrodeposition; flip chip; anisotropic conductive adhesive; CONTACT RESISTANCE; RELIABILITY; FABRICATION;
D O I
10.2320/matertrans.M2015236
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A thermoelectric thin-film device with a cross-plane configuration was fabricated by the flip-chip process using an anisotropic conductive adhesive. The Cu/Au bumps on the top substrate were flip-chip bonded to the 242 pairs of the n-type Bi2Te3 and p-type Sb2Te3 thin-film legs electrodeposited on the bottom substrate. The internal resistance of the thin-film device was 59 Omega, most of which can be attributed to the interfacial resistance of the 484 flip-chip joints. The thin-film device exhibited an open-circuit voltage of 382 mV and a maximum output power of 652 mu W for a temperature difference of 36.8 K applied across its top and bottom substrates.
引用
收藏
页码:109 / 114
页数:6
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