Pioneering Development of Immersion Lithography

被引:0
作者
Uchiyama, Takayuki
机构
来源
NEC TECHNICAL JOURNAL | 2009年 / 4卷 / 01期
关键词
lithography; micro-fabrication; immersion; 55nm logic LSI; exposure; resist;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
NEC Electronics has pioneered the development of the immersion lithography technology in order to deal with micro-fabrication from the 65nm logic to the 55nm logic and after. Instead of air, the immersion technology introduces water between the lens and wafer of the exposure system for use in fabricating the circuit pattern and this makes it possible to improve the resolution and to fabricate finer patterns than have been achieved hitherto. NEC Electronics has completed the material development, exposure system development and process optimization for this technology and the process is currently being applied to mass-production of the 300mm wafer production line at the NEC Semiconductors Yamagata factory.
引用
收藏
页码:58 / 62
页数:5
相关论文
共 4 条
[1]  
KODAMA T, 3 INT S IMM LITH PO
[2]  
NAKATA T, 2007, EVALUATION IMMERSION
[3]  
UCHIYAMA T, 2007, 2007 LITH WORKSH
[4]  
UCHIYAMA T, 2007, BEN ARF IMM LITH 55