Single-shot spectrometry for x-ray free-electron lasers

被引：44

作者：

Yabashi, Makina

Hastings, Jerome B.

Zolotorev, Max S.

Mimura, Hidekazu

Yumoto, Hirokatsu

Matsuyama, Satoshi

Yamauchi, Kazuto

Ishikawa, Tetsuya

机构：

[1] JASRI, SPring 8, Sayo, Hyogo 6795198, Japan

[2] Stanford Synchrotron Radiat Lab, SLAC, Menlo Pk, CA 94025 USA

[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Ctr Beam Phys, Div Accelerator & Fus Res, Berkeley, CA 94720 USA

[4] Osaka Univ, Grad Sch Engn, Dept Precis Sci & Technol, Suita, Osaka 5650871, Japan

[5] SPring 8 RIKEN, Sayo, Hyogo 6795148, Japan

来源：

PHYSICAL REVIEW LETTERS | 2006年 / 97卷 / 08期

关键词：

SYNCHROTRON-RADIATION; ENERGY RESOLUTION; OPTICS; MONOCHROMATOR;

D O I：

10.1103/PhysRevLett.97.084802

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

An experimental scheme to realize single-shot spectrometry for the diagnostics of x-ray free-electron lasers (XFELs) is presented. The combination of an ultraprecisely figured mirror and a perfect crystal form a simple, high-precision spectrometer that can cover an energy range from a few eV to a hundred eV with high resolution. The application of the spectrometer to determine XFEL pulse widths was investigated theoretically and experimentally. It has been shown that the present system can determine pulse widths from sub-fs to ps in a single shot even for spontaneous radiation. The system can be easily extended to even shorter pulses.

引用

页数：4

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