Finite size effects on the gate leakage current in graphene nanoribbon field-effect transistors

被引:15
|
作者
Mao, Ling-Feng [1 ]
机构
[1] Soochow Univ, Sch Elect & Informat Engn, Suzhou 215021, Peoples R China
基金
美国国家科学基金会; 中国国家自然科学基金;
关键词
D O I
10.1088/0957-4484/20/27/275203
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The finite size effects in nanoribbon graphene field-effect transistors (FETs) make the energy distribution of the channel electrons very different from that when neglecting finite size effects. Such an effect is especially obvious when the width of the graphene ribbon is a few nanometers. Thus, it results in more high-energy electrons in a nanoribbon graphene FET than in a two-dimensional graphene FET for the same device structure and parameters. Furthermore, such an energy distribution of channel electrons results in a change in the gate leakage current of a nanoribbon graphene FET. The numerical calculations demonstrate that the tunneling current rapidly increases with decreasing width of the graphene ribbon. This implies that a workable graphene FET after considering gate oxide reliability should have a channel width larger than 100 nm.
引用
收藏
页数:4
相关论文
共 50 条
  • [1] Finite-Size and Edge Effects on the Quantum Capacitance of Graphene Nanoribbon Field-Effect Transistors
    Kliros, George S.
    2014 INTERNATIONAL SEMICONDUCTOR CONFERENCE (CAS), 2014, : 63 - 66
  • [2] Graphene nanoribbon field-effect transistors
    Thornhill, Stephen
    Wu, Nathanael
    Wang, Z. F.
    Shi, Q. W.
    Chen, Jie
    PROCEEDINGS OF 2008 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-10, 2008, : 169 - +
  • [3] The gate leakage current in graphene field-effect transistor
    Mao, Ling-Feng
    Li, Xijun
    Wang, Zi-Ou
    Wang, Jin-Yan
    IEEE ELECTRON DEVICE LETTERS, 2008, 29 (09) : 1047 - 1049
  • [4] Gate capacitance model for the design of graphene nanoribbon array field-effect transistors
    Son, Myungwoo
    Ki, Hangil
    Kim, Kihyeun
    Chung, Sunki
    Lee, Woong
    Ham, Moon-Ho
    RSC ADVANCES, 2015, 5 (68) : 54861 - 54866
  • [5] Graphene Nanoribbon Field-Effect Transistors with Top-Gate Polymer Dielectrics
    Jeong, Beomjin
    Wuttke, Michael
    Zhou, Yazhou
    Muellen, Klaus
    Narita, Akimitsu
    Asadi, Kamal
    ACS APPLIED ELECTRONIC MATERIALS, 2022, 4 (06) : 2667 - 2671
  • [6] Simulation of graphene nanoribbon field-effect transistors
    Fiori, Gianluca
    Iannaccone, Giuseppe
    IEEE ELECTRON DEVICE LETTERS, 2007, 28 (08) : 760 - 762
  • [7] Theoretical study of the source-drain current and gate leakage current to understand the graphene field-effect transistors
    Yu, Cui
    Liu, Hongmei
    Ni, Wenbin
    Gao, Nengyue
    Zhao, Jianwei
    Zhang, Haoli
    PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2011, 13 (08) : 3461 - 3467
  • [8] An analytical drain current model for graphene nanoribbon tunnel field-effect transistors
    Bao, Jiarui
    Hu, Shuyan
    Hu, Guangxi
    Hu, Laigui
    Liu, Ran
    Zheng, Lirong
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2019, 58 (09)
  • [9] Energy distribution of channel electrons and its impacts on the gate leakage current in graphene field-effect transistors
    Mao, Ling-Feng
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2010, 98 (03): : 565 - 569
  • [10] Energy distribution of channel electrons and its impacts on the gate leakage current in graphene field-effect transistors
    Ling-Feng Mao
    Applied Physics A, 2010, 98 : 565 - 569