Effects of annealing on near-infrared shielding properties of Cs-doped tungsten oxide thin films deposited by electron beam evaporation

被引：23
|
作者：
Long, Chak Seng [1 ]
Lu, Horng-Hwa [2 ]
Lii, Ding-Fwu [3 ]
Huang, Jow-Lay [1 ,4 ]
机构：
[1] Natl Cheng Kung Univ, Dept Mat Sci & Engn, Tainan 701, Taiwan
[2] Natl Chin Yi Univ Technol, Dept Mech Engn, Taichung 41170, Taiwan
[3] Cheng Shiu Univ, Dept Elect Engn, Kaohsiung 833, Taiwan
[4] Natl Univ Kaohsiung, Dept Chem & Mat Engn, Kaohsiung 81148, Taiwan
来源：
SURFACE & COATINGS TECHNOLOGY | 2015年 / 284卷
关键词：
Tungsten bronze; CsxWO3; Near-infrared shielding; Optical properties; OPTICAL PROPERTIES; BRONZE; ABSORPTION; CSXWO3; MICROSTRUCTURE; PARTICLES;
D O I：
10.1016/j.surfcoat.2015.06.078
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Near-infrared (NIR) shielding properties are important for solar films. In this study, CsxWO3 films prepared using electron beam evaporation were characterized using X-ray diffraction, X-ray photoelectron spectroscopy, and spectrophotometry. The effects of annealing on NIR shielding properties and film microstructure were investigated. The results show that the NIR shielding properties of CsxWO3 films can be improved by annealing at 300-450 degrees C under pure H-2 atmosphere, the amorphous thin films being transformed to crystalline films. The CsxWO3 films annealed at 450 degrees C in pure H-2 atmosphere showed high transmittance of visible light (70%) and high NIR shielding ratio (99%). (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码：75 / 79
页数：5
相关论文
共 47 条
  • [1] Optical properties of erbium oxide thin films deposited by electron beam evaporation
    Al-Kuhaili, M. F.
    Durrani, S. M. A.
    THIN SOLID FILMS, 2007, 515 (05) : 2885 - 2890
  • [2] Optical properties of chromium oxide thin films deposited by electron-beam evaporation
    Al-Kuhaili, M. F.
    Durrani, S. M. A.
    OPTICAL MATERIALS, 2007, 29 (06) : 709 - 713
  • [3] High near-infrared transmittance, high intense orange luminescence in vanadium doped indium oxide (V: In2O3) thin films deposited by electron beam evaporation
    Islam, Md. Ariful
    Mou, Jannatul Robaiat
    Roy, Ratan Chandra
    Hossain, Jaker
    Julkarnain, Md.
    Khan, Khairul Alam
    OPTIK, 2018, 157 : 208 - 216
  • [4] Influence of Substrate Temperature on Properties of ZnSe Thin Films Deposited by Electron-beam Evaporation
    Zhao Guangyu
    Xu Li
    Fan Jie
    Zhang Jiabin
    Lan Yunping
    Zou Yonggang
    Ma Xiaohui
    ACTA PHOTONICA SINICA, 2021, 50 (06)
  • [5] Influence of ex-situ annealing on the properties of MgF2 thin films deposited by electron beam evaporation
    Reuna, Jarno
    Polojarvi, Ville
    Paakkonen, Pertti
    Lahtonen, Kimmo
    Raappana, Marianna
    Aho, Timo
    Isoaho, Riku
    Aho, Arto
    Valden, Mika
    Guina, Mircea
    OPTICAL MATERIALS, 2019, 96
  • [6] The influence of annealing temperature on the structure and optical properties of silicon films deposited by electron beam evaporation
    Liu Bao-Jian
    Duan Wei-Bo
    Li Da-Qi
    Yu De-Ming
    Chen Gang
    Liu Ding-Quan
    JOURNAL OF INFRARED AND MILLIMETER WAVES, 2020, 39 (01) : 1 - 5
  • [7] Effects of Annealing in Different Atmosphere on the Near-Infrared Shielding Properties of CsxWO3 Particles
    Xu, Qiang
    Liu, Jingxiao
    Shi, Fei
    Luo, Jiayu
    Jiang, Yanyan
    Liu, Guishan
    ADVANCES IN MANUFACTURING SCIENCE AND ENGINEERING, PTS 1-4, 2013, 712-715 : 284 - 287
  • [8] Effect of substrate temperature on the near-infrared shielding properties of WO3-x thin films deposited by RF magnetron sputtering
    Nair, Anjana S.
    Keerthana, C. S.
    Abraham, Jisha Elsa
    George, Pranav
    Joseph, Cyriac
    Biju, P. R.
    Unnikrishnan, N. V.
    Saritha, A. C.
    VACUUM, 2022, 202
  • [9] Near-infrared reflection from periodically aluminium-doped zinc oxide thin films
    Okuhara, Yoshiki
    Kato, Takeharu
    Matsubara, Hideaki
    Isu, Norifumi
    Takata, Masasuke
    THIN SOLID FILMS, 2011, 519 (07) : 2280 - 2286
  • [10] Structural and Magnetic properties of Cr-diffused CdTe nanocrystalline thin films deposited by electron beam evaporation
    Begam, M. Rigana
    Rao, N. Madhusudhana
    Kaleemulla, S.
    Krishnamoorthi, C.
    Krishna, N. Sai
    Kuppan, M.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2014, 117 (02): : 793 - 798
12345