Tensile properties of Cu/Sn-58Bi/Cu soldered joints subjected to isothermal aging

The effects of isothermal aging on the tensile properties of Cu/Sn-58Bi/Cu soldered joints were investigated. Experimental results show that the scallop-shaped Cu6Sn5 and planar Cu3Sn formed at the interface between solder and Cu substrate during reflowing and aging. The thickness of the intermetallic compounds (IMCs) increased almost linearly with the square root of aging time, and aging at 120 A degrees C yielded a much faster growth of the IMCs layer than that of samples aged at 100 A degrees C. The IMCs growth rate constants were 6.02 x 10(-18) and 1.85 x 10(-18) m(2) s(-1) for solder joints aged at 120 and 100 A degrees C, respectively. The tensile strength of the Sn-58Bi/Cu soldered joints decreased slightly with the increasing aging time and temperature. The failure was dominated by the mixed fracturing in both the solder and the Cu6Sn5 grains irrespective of their thermal aging conditions. However, the fracture pattern tended to transform from ductile to brittle with increasing aging time and temperature. The Bi segregation and voids were observed around the Cu/Cu3Sn interface as the long term aging at high aging temperature was carried out, which resulted in reduction of tensile strength of solder joints.