X-ray diffraction study of the crystallographic characteristics of TlInS x Se2-x solid solutions

被引：8

作者：

Sheleg, A. U. ^{[1
]}

Hurtavy, V. G. ^{[1
]}

Shautsova, V. V. ^{[1
]}

Aliev, V. A. ^{[2
]}

机构：

[1] Natl Acad Sci Belarus, Sci Pract Mat Res Ctr, Minsk, BELARUS

[2] Azerbaijan Acad Sci, Inst Phys, AZ-1143 Baku, Azerbaijan

来源：

CRYSTALLOGRAPHY REPORTS | 2014年 / 59卷 / 02期

关键词：

INCOMMENSURATE PHASE;

D O I：

10.1134/S1063774514020229

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Crystallographic parameters of TlInS (x) Se2 - x solid solutions have been measured by X-ray diffraction. Dependences of the unit-cell parameters on the composition are determined. It is established that the values of parameters a, b, and c and the angle beta decrease with an increase in x. It is shown that the TlInS (x) Se2 - x system includes a continuous series of solid solutions based on the TlInSe2 compound with tetragonal symmetry at x values a parts per thousand currency sign 0.4, while at x a parts per thousand yen 0.6 solid solutions based on the TlInS2 compound with a monoclinic structure are formed.

引用

页码：186 / 189

页数：4

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