X-ray diffraction study of the crystallographic characteristics of TlInS x Se2-x solid solutions

Crystallographic parameters of TlInS (x) Se2 - x solid solutions have been measured by X-ray diffraction. Dependences of the unit-cell parameters on the composition are determined. It is established that the values of parameters a, b, and c and the angle beta decrease with an increase in x. It is shown that the TlInS (x) Se2 - x system includes a continuous series of solid solutions based on the TlInSe2 compound with tetragonal symmetry at x values a parts per thousand currency sign 0.4, while at x a parts per thousand yen 0.6 solid solutions based on the TlInS2 compound with a monoclinic structure are formed.