X-ray diffraction study of the crystallographic characteristics of TlInS x Se2-x solid solutions

被引：8
|
作者：
Sheleg, A. U. [1 ]
Hurtavy, V. G. [1 ]
Shautsova, V. V. [1 ]
Aliev, V. A. [2 ]
机构：
[1] Natl Acad Sci Belarus, Sci Pract Mat Res Ctr, Minsk, BELARUS
[2] Azerbaijan Acad Sci, Inst Phys, AZ-1143 Baku, Azerbaijan
来源：
CRYSTALLOGRAPHY REPORTS | 2014年 / 59卷 / 02期
关键词：
INCOMMENSURATE PHASE;
D O I：
10.1134/S1063774514020229
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
Crystallographic parameters of TlInS (x) Se2 - x solid solutions have been measured by X-ray diffraction. Dependences of the unit-cell parameters on the composition are determined. It is established that the values of parameters a, b, and c and the angle beta decrease with an increase in x. It is shown that the TlInS (x) Se2 - x system includes a continuous series of solid solutions based on the TlInSe2 compound with tetragonal symmetry at x values a parts per thousand currency sign 0.4, while at x a parts per thousand yen 0.6 solid solutions based on the TlInS2 compound with a monoclinic structure are formed.
引用
收藏
页码：186 / 189
页数：4
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