Fault diagnosis of analog circuits based on adaptive test and output characteristics

被引：4

作者：

Miura, Yukiya ^{[1
]}

Kato, Jiro ^{[1
]}

机构：

[1] Tokyo Metropolitan Univ, Grad Sch Syst Design, Tokyo 158, Japan

来源：

21ST IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT-TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS | 2006年

关键词：

adaptive test; analog circuits; fault diagnosis; MOS transistors; operation-region model; X-Y zoning method;

D O I：

10.1109/DFT.2006.30

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

We have proposed a method for diagnosing analog circuits that is realized by combining the operation-region model and the X-Y zoning method. In the method we cloud implement a diagnosis procedure based on a diagnostic method for digital circuits. In this paper, we improve the method by using an adaptive test to obtain a shorter diagnostic sequence length and show its characteristics. Moreover, we propose a new data processing method that utilizes the output response of a circuit to obtain better diagnostic performance. We demonstrate the effectiveness of the proposed methods by applying them to ITC'97 benchmark circuits with hard faults and soft faults. These improved methods can reduce a diagnostic sequence length without degrading the performance of diagnostic resolution and CPU time.

引用

页码：410 / +

页数：2

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