Thermal Characterization of Low-Dimensional Materials by Resistance Thermometers

被引：7

作者：

Fu, Yifeng ^{[1
]}

Cui, Guofeng ^{[2
]}

Jeppson, Kjell ^{[1
]}

机构：

[1] Chalmers Univ Technol, Dept Microtechnol & Nanosci, Elect Mat & Syst Lab, SE-41296 Gothenburg, Sweden

[2] Sun Yat Sen Univ, Key Lab Low Carbon Chem & Energy Conservat Guangd, Mat Sci Inst,Sch Chem, Key Lab Polymer Composite & Funct Mat,Minist Educ, Guangzhou 510275, Guangdong, Peoples R China

来源：

MATERIALS | 2019年 / 12卷 / 11期

基金：

欧盟地平线“2020”; 美国国家科学基金会;

关键词：

thermal characterization; resistance temperature detector; heat spreader; carbon nanotube; graphene; boron nitride; CARBON NANOTUBES; INTERFACE MATERIALS; GRAPHENE; CONDUCTIVITY; COMPOSITES; MANAGEMENT; FUNCTIONALIZATION; NANOCOMPOSITES; PERFORMANCE; STRENGTH;

D O I：

10.3390/ma12111740

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The design, fabrication, and use of a hotspot-producing and temperature-sensing resistance thermometer for evaluating the thermal properties of low-dimensional materials are described in this paper. The materials that are characterized include one-dimensional (1D) carbon nanotubes, and two-dimensional (2D) graphene and boron nitride films. The excellent thermal performance of these materials shows great potential for cooling electronic devices and systems such as in three-dimensional (3D) integrated chip-stacks, power amplifiers, and light-emitting diodes. The thermometers are designed to be serpentine-shaped platinum resistors serving both as hotspots and temperature sensors. By using these thermometers, the thermal performance of the abovementioned emerging low-dimensional materials was evaluated with high accuracy.

引用

页数：15

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