Cross sections for electron scattering from thiophene for a broad energy range

被引:8
|
作者
Loupas, Alexandra [1 ,2 ]
Lozano, Ana, I [3 ]
Blanco, Francisco [4 ]
Gorfinkiel, Jimena D. [2 ]
Garcia, Gustavo [3 ]
机构
[1] Univ Nova Lisboa, Lab Colisoes Atom & Mol, CEFITEC, Dept Fis,Fac Ciencias & Tecnol, Campus Caparica, P-2829516 Lisbon, Portugal
[2] Open Univ, Sch Phys Sci, Walton Hall, Milton Keynes MK7 6AA, Bucks, England
[3] CSIC, Inst Fis Fundamental, Serrano 113 Bis, Madrid 28006, Spain
[4] Univ Complutense Madrid, Dept Fis Atom Mol & Nucl, Ciudad Univ, E-28040 Madrid, Spain
基金
英国工程与自然科学研究理事会;
关键词
SCREENING CORRECTIONS; SPECTROSCOPY; ATTACHMENT; MOLECULES; STATES; FURAN;
D O I
10.1063/1.5040352
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We present cross sections for elastic and inelastic electron scattering from thiophene calculated in the energy range 0.1-1000 eV. The R-matrix and independent atom representation-screening-corrected additivity rule (IAM-SCAR) methods were used for low-energy and intermediate and high scatter-ing energies, respectively. The results provide a consistent picture of the scattering process in the whole energy range. The effect of including an interference term in the IAM-SCAR approach is considered. Agreement with prior theoretical results is also discussed. Published by AIP Publishing.
引用
收藏
页数:8
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