Cross sections for electron scattering from thiophene for a broad energy range

被引：8

作者：

Loupas, Alexandra ^{[1
,2
]}

Lozano, Ana, I ^{[3
]}

Blanco, Francisco ^{[4
]}

Gorfinkiel, Jimena D. ^{[2
]}

Garcia, Gustavo ^{[3
]}

机构：

[1] Univ Nova Lisboa, Lab Colisoes Atom & Mol, CEFITEC, Dept Fis,Fac Ciencias & Tecnol, Campus Caparica, P-2829516 Lisbon, Portugal

[2] Open Univ, Sch Phys Sci, Walton Hall, Milton Keynes MK7 6AA, Bucks, England

[3] CSIC, Inst Fis Fundamental, Serrano 113 Bis, Madrid 28006, Spain

[4] Univ Complutense Madrid, Dept Fis Atom Mol & Nucl, Ciudad Univ, E-28040 Madrid, Spain

来源：

JOURNAL OF CHEMICAL PHYSICS | 2018年 / 149卷 / 03期

基金：

英国工程与自然科学研究理事会;

关键词：

SCREENING CORRECTIONS; SPECTROSCOPY; ATTACHMENT; MOLECULES; STATES; FURAN;

D O I：

10.1063/1.5040352

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We present cross sections for elastic and inelastic electron scattering from thiophene calculated in the energy range 0.1-1000 eV. The R-matrix and independent atom representation-screening-corrected additivity rule (IAM-SCAR) methods were used for low-energy and intermediate and high scatter-ing energies, respectively. The results provide a consistent picture of the scattering process in the whole energy range. The effect of including an interference term in the IAM-SCAR approach is considered. Agreement with prior theoretical results is also discussed. Published by AIP Publishing.

引用

页数：8

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