The Electroluminescence Spectra of InGaN/GaN Blue LEDs During Aging Time

被引:0
作者
Dai Shuang [1 ]
Yu Tong-jun [1 ]
Li Xing-bin [1 ]
Yuan Gang-cheng [1 ]
Lu Hui-min [1 ]
机构
[1] Peking Univ, Sch Phys, State Key Lab Artificial Microstruct & Mesoscop P, Beijing 100871, Peoples R China
关键词
InGaN/GaN blue LEDs; Degradation; Electroluminescence spectra; Polarization field; MULTIPLE-QUANTUM WELLS; DEGRADATION; STRESS; DIODES;
D O I
10.3964/j.issn.1000-0593(2014)02-0327-04
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The luminescence spectra of InGaN/GaN multiple quantum wells light-emitting diodes under low level injection current (<4 mA) during aging process was investigated for the first time. Comparing the electroluminescence (EL) spectra of LEDs before and after aging time it was found that the peak wavelength and the full width at half maximum (FWHM) decreased with stress time and the changes of EL spectrum had two different stages drastic decrease at the early stress stage and slow decrease later showing the same trend with the output optical power of LEDs, which indicates that the effective polarization electric field of LEDs becomes weak during the aging process and the change has a clear correlation with the increase of the defects in the multiple quantum wells of LEDs. Electrical measurement revealed that junction capacitance (C-j) under the same junction voltage (V-j =1. 8 V) and the junction voltage (V-j) with the same injection current 1 mA calculated by ac small-signal IV method increased along with aging time, which explicates that the carrier density under the same low injection increases as the aging time increases. Analyses indicate that the polarization field in the quantum well is more seriously screened by the increased carriers captured by defects activated during stress time, the weaker effective polarization electric field makes the tilt of the energy band smaller, the energy radiated through the band edge and the density of energy states of the band edge increase which leads to the behaviors of peak wavelength and the FWHM of InGaN/GaN multiple quantum wells LEDs under low level injection current.
引用
收藏
页码:327 / 330
页数:4
相关论文
共 14 条
  • [1] S-shaped temperature-dependent emission shift and carrier dynamics in InGaN/GaN multiple quantum wells
    Cho, YH
    Gainer, GH
    Fischer, AJ
    Song, JJ
    Keller, S
    Mishra, UK
    DenBaars, SP
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (10) : 1370 - 1372
  • [2] Interdiffusion of In and Ga in InGaN/GaN multiple quantum wells
    Chuo, CC
    Lee, CM
    Chyi, JI
    [J]. APPLIED PHYSICS LETTERS, 2001, 78 (03) : 314 - 316
  • [3] Deep saturation of junction voltage at large forward current of light-emitting diodes
    Feng, L. F.
    Li, D.
    Zhu, C. Y.
    Wang, C. D.
    Cong, H. X.
    Zhang, G. Y.
    Du, W. M.
    [J]. JOURNAL OF APPLIED PHYSICS, 2007, 102 (09)
  • [4] High-Power and High-Efficiency InGaN-Based Light Emitters
    Laubsch, Ansgar
    Sabathil, Matthias
    Baur, Johannes
    Peter, Matthias
    Hahn, Berthold
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2010, 57 (01) : 79 - 87
  • [5] Modulating lateral strain in GaN-based epitaxial layers by patterning sapphire substrates with aligned carbon nanotube films
    Long, Hao
    Wei, Yang
    Yu, Tongjun
    Wang, Zhe
    Jia, Chuanyu
    Yang, Zhijian
    Zhang, Guoyi
    Fan, Shoushan
    [J]. NANO RESEARCH, 2012, 5 (09) : 646 - 653
  • [6] Investigation of the electroluminescence spectrum shift of InGaN/GaN multiple quantum well light-emitting diodes under direct and pulsed currents
    Lu, Cimang
    Wang, Lei
    Lu, Jianing
    Li, Rui
    Liu, Lei
    Li, Ding
    Liu, Ningyang
    Li, Lei
    Cao, Wenyu
    Yang, Wei
    Chen, Weihua
    Du, Weimin
    Lee, Ching-Ting
    Hu, Xiaodong
    [J]. JOURNAL OF APPLIED PHYSICS, 2013, 113 (01)
  • [7] High extraction efficiency light-emitting diodes based on embedded air-gap photonic-crystals
    Matioli, Elison
    Rangel, Elizabeth
    Iza, Micheal
    Fleury, Blaise
    Pfaff, Nathan
    Speck, James
    Hu, Evelyn
    Weisbuch, Claude
    [J]. APPLIED PHYSICS LETTERS, 2010, 96 (03)
  • [8] Meneghesso G, 2002, INTERNATIONAL ELECTRON DEVICES 2002 MEETING, TECHNICAL DIGEST, P103, DOI 10.1109/IEDM.2002.1175789
  • [9] A Review on the Physical Mechanisms That Limit the Reliability of GaN-Based LEDs
    Meneghini, Matteo
    Tazzoli, Augusto
    Mura, Giovanna
    Meneghesso, Gaudenzio
    Zanoni, Enrico
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2010, 57 (01) : 108 - 118
  • [10] Influence of quantum-well structural parameters on capacitance-voltage characteristics
    Moon, CR
    Lim, H
    [J]. APPLIED PHYSICS LETTERS, 1999, 74 (20) : 2987 - 2989