Ptychographic microscope for three-dimensional imaging

被引:105
作者
Godden, T. M. [1 ]
Suman, R. [1 ,2 ]
Humphry, M. J. [1 ]
Rodenburg, J. M. [1 ,3 ]
Maiden, A. M. [3 ]
机构
[1] Phase Focus Ltd, Elect Works, Sheffield S1 2BJ, S Yorkshire, England
[2] Univ York, Dept Biol, York YO10 5DD, N Yorkshire, England
[3] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England
基金
英国工程与自然科学研究理事会;
关键词
ELECTRON-MICROSCOPY; DIFFRACTION; INFORMATION; SCATTERING; ERRORS;
D O I
10.1364/OE.22.012513
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Ptychography is a coherent imaging technique that enables an image of a specimen to be generated from a set of diffraction patterns. One limitation of the technique is the assumption of a multiplicative interaction between the illuminating coherent beam and the specimen, which restricts ptychography to samples no thicker than a few tens of micrometers in the case of visible-light imaging at micron-scale resolution. By splitting a sample into axial sections, we demonstrated in recent work that this thickness restriction can be relaxed and whats-more, that coarse optical sectioning can be realized using a single ptychographic data set. Here we apply our technique to data collected from a modified optical microscope to realize a reduction in the optical sectioning depth to 2 m in the axial direction for samples up to 150 m thick. Furthermore, we increase the number of sections that are imaged from 5 in our previous work to 34 here. Our results compare well with sectioned images collected from a confocal microscope but have the added advantage of strong phase contrast, which removes the need for sample staining. (C) 2014 Optical Society of America
引用
收藏
页码:12513 / 12523
页数:11
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