Emissivity of liquid silicon in visible and infrared regions

被引：40

作者：

Takasuka, E ^{[1
]}

Tokizaki, E ^{[1
]}

Terashima, K ^{[1
]}

Kimura, S ^{[1
]}

机构：

[1] RES DEV CORP JAPAN, RES ADM, KIMURA METAMELT PROJECT, KAWASAKI, KANAGAWA 332, JAPAN

来源：

JOURNAL OF APPLIED PHYSICS | 1997年 / 81卷 / 09期

关键词：

D O I：

10.1063/1.364418

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Normal spectral emissivity of Si melt in visible and infrared regions was determined by the direct measurement of thermal radiations from the melt and a blackbody cavity which was located close to the melt. The spectral emissivity slightly decreases with wavelength. The emissivity slightly changes with temperature, The spectral emissivity values in visible and in infrared region are 0.27 and 0.21, respectively. The wavelength dependence of the emissivity can be interpreted by a dielectric response of free electrons in the melt. (C) 1997 American Institute of Physics.

引用

页码：6384 / 6389

页数：6

共 11 条

[1]

Bruckner R., 1970, Journal of Non-Crystalline Solids, V5, P123, DOI 10.1016/0022-3093(70)90190-0

[2] MEASUREMENTS OF THE OPTICAL-PROPERTIES OF LIQUID SILICON AND GERMANIUM USING NANOSECOND TIME-RESOLVED ELLIPSOMETRY [J].

JELLISON, GE ;

LOWNDES, DH .

APPLIED PHYSICS LETTERS, 1987, 51 (05) :352-354

[3]

KRISHNAN S, 1990, HIGH TEMP SCI, V30, P137

[4]

Massalski T.B., 1996, Binary Alloy Phase Diagrams, V2nd

[5] TEMPERATURE-DEPENDENCE OF THE ELECTRICAL-RESISTIVITY OF MOLTEN SILICON [J].

SASAKI, H ;

IKARI, A ;

TERASHIMA, K ;

KIMURA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (7A) :3426-3431

[6] DENSITY VARIATION OF MOLTEN SILICON MEASURED BY AN IMPROVED ARCHIMEDEAN METHOD [J].

SASAKI, H ;

TOKIZAKI, E ;

TERASHIMA, K ;

KIMURA, S .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1994, 33 (7A) :3803-3807

[7]

SHVAREV KM, 1975, FIZ TVERD TELA, V16, P2111

[8]

Siegel R, 1992, Thermal radiation heat transfer, VThird

[9]

Sparrow EM., 1962, J HEAT TRANSFER, V84, P73, DOI [10.1115/1.3684295, DOI 10.1115/1.3684295]

[10] DIRECT MEASUREMENT OF SPECTRAL EMISSIVITY OF LIQUID SI IN THE RANGE OF VISIBLE-LIGHT [J].

TAKASUKA, E ;

TOKIZAKI, E ;

TERASHIMA, K ;

KIMURA, S .

APPLIED PHYSICS LETTERS, 1995, 67 (02) :152-154

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