In situ observation of the formation process for free-standing Au nanowires with a scanning electron microscope

We have developed a simultaneous electronic and structural characterization method for studying the formation process for Au nanowires. The method is based on two-probe electronic transport measurement of free-standing Au nanowires and simultaneous structural characterization using scanning electron microscopy (SEM). We measured the electronic currents during the electromigration (EM)-induced narrowing process for the free-standing Au nanowires. A free-standing Au nanowire with a desired conductance value was fabricated by EM. Simultaneous SEM and conductance measurements revealed the EM-induced narrowing process for the Au wires, in which material transfer in the nanowires caused growth towards the positively biased electrode and contact failure at the negatively biased electrode. The narrowed free-standing Au nanowires were stable and could be maintained for more than 10 h without their conductance changing. These results indicate the high stability of the EM-processed Au nanowires compared to Au nanowires fabricated by mechanical elongation or the breaking of Au nanocontacts.