Preparation of TEM samples of metal-oxide interface by the focused ion beam technique

被引：18

作者：

Abolhassani, S. ^{[1
]}

Gasser, Philippe

机构：

[1] Paul Scherrer Inst, Lab Mat Behav, CH-5232 Villigen, Switzerland

[2] EMPA, Swiss Fed Inst Mat Testing & Res, CH-8600 Dubendorf, Switzerland

来源：

JOURNAL OF MICROSCOPY-OXFORD | 2006年 / 223卷

关键词：

energy dispersive X-ray spectrometer (EDS) analysis by TEM; focused ion beam (FIB); irradiated Zircaloy-4; 'Lift-out'; metal-oxide interface; TEM; TEM specimen preparation;

D O I：

10.1111/j.1365-2818.2006.01599.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

This paper describes a procedure to prepare metal-oxide interfaces for transmission electron microscopy by the focused ion beam technique. The advantage of this procedure is to allow the observation of metal-oxide interfaces of irradiated samples with a homogeneous thickness without the need to have an instrument inside laboratories that are specialized for the manipulation of irradiated materials. A transmission electron microscopy sample is prepared by this method and analysed.

引用

页码：73 / 82

页数：10

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