Double differential distributions of electron emission in ion-atom and electron-atom collisions using an electron spectrometer

被引:45
作者
Misra, Deepankar [1 ]
Thulasiram, K. V. [1 ]
Fernandes, W. [1 ]
Kelkar, Aditya H. [1 ]
Kadhane, U. [1 ]
Kumar, Ajay [1 ]
Singh, Yeshpal [1 ]
Gulyas, L. [2 ]
Tribedi, Lokesh C. [1 ]
机构
[1] Tata Inst Fundamental Res, Bombay 400005, Maharashtra, India
[2] Hungarian Acad Sci, Inst Nucl Res, ATOMKI, H-4001 Debrecen, Hungary
关键词
Electron spectroscopy; Hemispherical analyzer; Ionization; Ion-atom collision; Electron-atom collision; Electron emission; LOW-ENERGY ELECTRONS; CROSS-SECTIONS; IONIZATION; DEPENDENCE; ASYMMETRY; PEAK; HE; INTERFERENCE; RESOLUTION; HELIUM;
D O I
10.1016/j.nimb.2008.10.091
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We study electron emission from atoms and molecules in collisions with fast electrons and heavy ions (C6+). The soft collision electrons (SE), two center electron emission (TCEE), the binary encounter (BE) events and the KILL Auger lines along with the elastically scattered peaks (in electron collisions) are studied using a hemispherical electrostatic electron analyzer. The details of the measurements along with description of the spectrometer and data acquisition system are given. The angular distributions of the low energy (few eV) electrons in soft collisions and the binary encounter electrons at keV energies are compared with quantum mechanical models based on the first Born (B1) and the continuum distorted wave-Eikonal initial state approximation (CDW-EIS). (c) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:157 / 162
页数:6
相关论文
共 42 条
[1]   Improving the energy resolution of a hemispherical spectrograph using a paracentric entry at a non-zero potential [J].
Benis, EP ;
Zouros, TJM .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2000, 440 (02) :462-465
[2]   ANGULAR AND ENERGY-DEPENDENCE OF CROSS-SECTIONS FOR EJECTION OF ELECTRONS FROM WATER-VAPOR .1. 50-2000-EV ELECTRON-IMPACT [J].
BOLORIZADEH, MA ;
RUDD, ME .
PHYSICAL REVIEW A, 1986, 33 (02) :882-887
[3]   INTERFERENCE IN PHOTO-IONIZATION OF MOLECULES [J].
COHEN, HD ;
FANO, U .
PHYSICAL REVIEW, 1966, 150 (01) :30-&
[4]   IONIZATION OF ATOMS BY ION IMPACT [J].
CROTHERS, DSF ;
MCCANN, JF .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1983, 16 (17) :3229-3242
[5]   2-CENTER EFFECTS IN IONIZATION BY ION IMPACT [J].
FAINSTEIN, PD ;
PONCE, VH ;
RIVAROLA, RD .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1991, 24 (14) :3091-3119
[6]   Angular asymmetry of low-energy electron emission in ion-atom collisions [J].
Fainstein, PD ;
Gulyas, L ;
Martin, F ;
Salin, A .
PHYSICAL REVIEW A, 1996, 53 (05) :3243-3246
[7]   Young-type interference patterns in electron emission spectra produced by impact of swift ions on H2 molecules -: art. no. 052705 [J].
Galassi, ME ;
Rivarola, RD ;
Fainstein, PD ;
Stolterfoht, N .
PHYSICAL REVIEW A, 2002, 66 (05) :4
[8]   ENERGY SHIFTS OF BINARY-ENCOUNTER ELECTRON PEAKS IN ION ATOM COLLISIONS [J].
GONZALEZ, AD ;
DAHL, P ;
HVELPLUND, P ;
FAINSTEIN, PD .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1993, 26 (06) :L135-L140
[9]   ANGULAR-DEPENDENCE OF QUASI-FREE ELECTRONS SCATTERED BY FAST MULTIPLY CHARGED IONS [J].
GONZALEZ, AD ;
DAHL, P ;
HVELPLUND, P ;
TAULBJERG, K .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1992, 25 (22) :L573-L578
[10]   SECONDARY-ELECTRON-PRODUCTION CROSS-SECTIONS FOR ELECTRON-IMPACT IONIZATION OF MOLECULAR NITROGEN [J].
GORUGANTHU, RR ;
WILSON, WG ;
BONHAM, RA .
PHYSICAL REVIEW A, 1987, 35 (02) :540-558