Double differential distributions of electron emission in ion-atom and electron-atom collisions using an electron spectrometer

被引:44
作者
Misra, Deepankar [1 ]
Thulasiram, K. V. [1 ]
Fernandes, W. [1 ]
Kelkar, Aditya H. [1 ]
Kadhane, U. [1 ]
Kumar, Ajay [1 ]
Singh, Yeshpal [1 ]
Gulyas, L. [2 ]
Tribedi, Lokesh C. [1 ]
机构
[1] Tata Inst Fundamental Res, Bombay 400005, Maharashtra, India
[2] Hungarian Acad Sci, Inst Nucl Res, ATOMKI, H-4001 Debrecen, Hungary
关键词
Electron spectroscopy; Hemispherical analyzer; Ionization; Ion-atom collision; Electron-atom collision; Electron emission; LOW-ENERGY ELECTRONS; CROSS-SECTIONS; IONIZATION; DEPENDENCE; ASYMMETRY; PEAK; HE; INTERFERENCE; RESOLUTION; HELIUM;
D O I
10.1016/j.nimb.2008.10.091
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We study electron emission from atoms and molecules in collisions with fast electrons and heavy ions (C6+). The soft collision electrons (SE), two center electron emission (TCEE), the binary encounter (BE) events and the KILL Auger lines along with the elastically scattered peaks (in electron collisions) are studied using a hemispherical electrostatic electron analyzer. The details of the measurements along with description of the spectrometer and data acquisition system are given. The angular distributions of the low energy (few eV) electrons in soft collisions and the binary encounter electrons at keV energies are compared with quantum mechanical models based on the first Born (B1) and the continuum distorted wave-Eikonal initial state approximation (CDW-EIS). (c) 2008 Elsevier B.V. All rights reserved.
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页码:157 / 162
页数:6
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