Electrical properties of AlGaAs/GaAs two-dimensional electron gases (2DEGs) grown on GaAs substrates cleaned by an electron cyclotron resonance (ECR) hydrogen plasma

被引:5
作者
Kondo, N
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1996年 / 35卷 / 11B期
关键词
ECR hydrogen plasma; regrowth; surface cleaning; 2DEG; HEMT; electron mobility; GaAs; AlGaAs; in situ vacuum process;
D O I
10.1143/JJAP.35.L1494
中图分类号
O59 [应用物理学];
学科分类号
摘要
AlGaAs/GaAs two-dimensional electron gases (2DEGs) are grown on GaAs substrates by molecular beam epitaxy (MBE) with various thicknesses of GaAs buffer layers. Prior to the growth, the substrates are cleaned using an electron cyclotron resonance (ECR) hydrogen plasma at low temperatures where native oxides are not removed from the surface by heating done. The electrical properties of 2DEGs are evaluated using van der Pauw and Hall effect measurements. The sheet carrier densities and electron mobilities of the plasma-cleaned samples with more than 20-nm-thick buffer lavers exhibit almost the same properties as the sample with a 600-nm-thick buffer layer at 77 K. ECR hydrogen plasma cleaning is found to be a promising technique for the regrowth process.
引用
收藏
页码:L1494 / L1497
页数:4
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