Fault dictionary size reduction through test response superposition

被引：17

作者：

Arslan, B ^{[1
]}

Orailoglu, A ^{[1
]}

机构：

[1] Univ Calif San Diego, Dept Comp Sci & Engn, La Jolla, CA 92093 USA

来源：

ICCD'2002: IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS | 2002年

关键词：

D O I：

10.1109/ICCD.2002.1106817

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The exceedingly large size of fault dictionaries constitutes a fundamental obstacle to their usage. We outline a new method to reduce significantly the size of fault dictionaries. The proposed method partitions the test set and a combined signature is stored for each partition. The new approach aims to provide high diagnostic resolution with a small number of combined signatures. The experimental results show a considerable decrease in the storage requirement of fault dictionaries.

引用

页码：480 / 485

页数：6

共 13 条

[1]

Abramovici M, 1990, DIGITAL SYSTEMS TEST

[2]

[Anonymous], 1979, Computers and Intractablity: A Guide to the Theoryof NP-Completeness

[3] Full fault dictionary storage based on labeled tree encoding [J].

Boppana, V ;

Hartanto, I ;

Fuchs, WK .

14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1996, :174-179

[4]

BOPPANA V, 1994, IEEE IC CAD, P576

[5]

Camurati P., 1990, EDAC. Proceedings of the European Design Automation Conference, P470, DOI 10.1109/EDAC.1990.136693

[6] Creating small fault dictionaries [J].

Chess, B ;

Larrabee, T .

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1999, 18 (03) :346-356

[7] Making cause-effect cost effective: Low-resolution fault dictionaries [J].

Lavo, DB ;

Larrabee, T .

INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS, 2001, :278-286

[8]

LEE HK, 1992, 29TH ACM/IEEE DESIGN AUTOMATION CONFERENCE : PROCEEDINGS, P336

[9]

LEE HK, 1293 STAT U VIRG POL

[10]

POMERANZ I, 1992, P INT C COMP AID DES, P272, DOI DOI 10.1109/ICCAD.1992.279361

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