Thickness dependence of transport properties of epitaxial SrRuO3 thin films grown on SrTiO3 substrates

被引：0

作者：

Herranz, G ^{[1
]}

Sánchez, F ^{[1
]}

García-Cuenca, MV ^{[1
]}

Ferrater, C ^{[1
]}

Varela, M ^{[1
]}

Martínez, B ^{[1
]}

Fontcuberta, J ^{[1
]}

机构：

[1] CSIC, Inst Ciencia Mat Barcelona, Bellaterra 08193, Spain

来源：

SPINTRONICS | 2002年 / 690卷

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

To study the effect of the film/substrate interface in thin films we have analyzed the thickness dependence of the transport properties of SrRuO3 films grown on SrTiO3 substrates. Our data makes evident the failure of the so-called dead layer model to describe the observed thickness dependence of the conductivity. This is interpreted as due to a non-monotonous change of microstructure as thickness increases. Indeed, Atomic Force Microscopy studies indicate substantial modifications of the growth mechanism with thickness.

引用

页码：43 / 48

页数：6

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