共 51 条
[1]
Anghel L, 2018, IEEE INT CONF VLSI, P176, DOI 10.1109/VLSI-SoC.2018.8644897
[2]
Test and Reliability in Approximate Computing
[J].
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,
2018, 34 (04)
:375-387
[3]
[Anonymous], 2006, BEARS
[4]
[Anonymous], 2017, 2017 IEEE COMPUTER S
[7]
Chen Y. Y., 2013, IEDM 2013
[8]
CHEN YG, 2009, IEDM 2009, P13
[10]
Fantini A, 2013, 2013 5TH IEEE INTERNATIONAL MEMORY WORKSHOP (IMW), P30, DOI 10.1109/IMW.2013.6582090