Rebooting Computing: The Challenges for Test and Reliability

被引:1
作者
Bosio, A. [1 ]
O'Connor, I [1 ]
Rodrigues, G. S. [2 ]
Lima, F. K. [2 ]
Vatajelu, E., I [3 ]
Di Natale, G. [3 ]
Anghel, L. [3 ]
Nagarajan, S. [4 ]
Fieback, M. C. R. [4 ]
Hamdioui, S. [4 ]
机构
[1] INL Ecole Cent Lyon, Lyon, France
[2] Univ Fed Rio Grande do Sul, PGMicro, Inst Informat, Porto Alegre, RS, Brazil
[3] Univ Grenoble Alpes, CNRS, Grenoble INP, TIMA, Grenoble, France
[4] Delft Univ Technol, Comp Engn Lab, Delft, Netherlands
来源
2019 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS (DFT) | 2019年
关键词
Alternative computing architectures; emerging technology; fault model; test; reliability; FAULTS; LOGIC; AREA;
D O I
10.1109/dft.2019.8875270
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Today's computer architectures and semiconductor technologies are facing major challenges making them incapable to deliver the required features (such as computer efficiency) for emerging applications. Alternative architectures are being under investigation in order to continue deliver sustainable benefits for the foreseeable future society at affordable cost. These architectures are not only changing the traditional computing paradigm (e.g., in terms of programming models, compilers, circuit design), but also setting up new challenges and directions on the way these architectures should be tested to guarantee the required quality and reliability levels. This paper highlights the major open questions regarding test and reliability of three emerging computing paradigms being approximate computing, computation-in-memory and neuromorphic computing.
引用
收藏
页数:6
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