Time-resolved thermoreflectivity of thin gold films and its dependence on film thickness

被引:147
作者
Hohlfeld, J
Muller, JG
Wellershoff, SS
Matthias, E
机构
[1] Fachbereich Physik, Freie Universität Berlin, 14195 Berlin
来源
APPLIED PHYSICS B-LASERS AND OPTICS | 1997年 / 64卷 / 03期
关键词
D O I
10.1007/s003400050189
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Transient linear reflectivities of thin gold films in the thickness range from 10 nm to 500 nm have been measured by femtosecond time-resolved pump-probe experiments. A conspicuous change of the relaxation behavior was found around 100 nm for pump pulse fluences of 1 mJ/cm(2). Thicker films show a nearly exponential decay of the transient linear reflectivity, which turns into a linear decay during the first 5-7 ps for films with thicknesses of 100 nm or less. This observation is evidence of a mean free path of about 100 nm for hot electrons with temperatures around 1500 K.
引用
收藏
页码:387 / 390
页数:4
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