Pulsed atomic-layer epitaxy of ultrahigh-quality AlxGa1-xN structures for deep ultraviolet emissions below 230 nm

被引:121
作者
Zhang, JP [1 ]
Khan, MA [1 ]
Sun, WH [1 ]
Wang, HM [1 ]
Chen, CQ [1 ]
Fareed, Q [1 ]
Kuokstis, E [1 ]
Yang, JW [1 ]
机构
[1] Univ S Carolina, Dept Elect Engn, Columbia, SC 29208 USA
关键词
D O I
10.1063/1.1528726
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this letter, we report the pulsed atomic-layer epitaxy of ultrahigh-quality AlN epilayers and AlN/Al0.85Ga0.15N multiple quantum wells (MQWs) on basal plane sapphire substrates. Symmetric and asymmetric x-ray diffraction (XRD) measurements and room-temperature (RT) photoluminescence (PL) were used to establish the ultrahigh structural and optical quality. Strong band-edge RT PL at 208 and 228 nm was obtained from the AlN epilayers and the AlN/Al0.85Ga0.15N MQWs. These data clearly establish their suitability for sub-250-nm deep UV emitters. (C) 2002 American Institute of Physics.
引用
收藏
页码:4392 / 4394
页数:3
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