On path-based learning and its applications in delay test and diagnosis

This paper describes the implementation of a novel path-based learning methodology that can be applied for two purposes: (1) In a pre-silicon simulation environment, path-based learning can be used to produce a fast and approximate simulator for statistical timing simulation. (2) In post-silicon phase, path-based learning can be used as a vehicle to derive critical paths based on the pass/fail behavior observed from the test chips. Our path-based learning methodology consists of four major components: a delay test pattern set, a logic simulator, a set of selected paths as the basis for learning, and a machine learner. We explain the key concepts in this methodology and present experimental results to demonstrate its feasibility and applications.