Transient Analysis of MLGNR Interconnects with Single Event (SE) Crosstalk Induced Effects Based on FDTD Model

被引:2
|
作者
Tan, Yiming [1 ]
Pan, Zhongliang [1 ]
机构
[1] South China Normal Univ, Sch Phys & Telecommun Engn, Guangzhou, Peoples R China
关键词
FDTD; intercalation doped TC-MLGNR; on-chip interconnects; single event crosstalk; PERFORMANCE;
D O I
10.1109/IAEAC54830.2022.9930037
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper investigates the single event crosstalk (SEC) effects for multilayer graphene nanoribbon (MLGNR) interconnects under various influencing factors, including temperature (200-600K), doping material, and the way of metal connection. A finite-difference time-domain (FDTD) model has been used to compare copper interconnects with MLGNR interconnects. And it has been discovered that lithium (Li) doped topcontact (TC) MLGNR interconnects are more resistant to SEC noise than copper or side-contact (SC) MLGNR interconnects. This paper also evaluates the output of interconnects that employ the current-mode signaling (CMS) or voltage-mode signaling (VMS) scheme under the influence of SEC. It is found that the CMS scheme has a greater advantage than the VMS scheme for resisting the SEC effects due to its smaller peak voltage and pulse width. The results of the SPICE simulation and those of the FDTD model proposed in this paper have shown to be very congruent.
引用
收藏
页码:1819 / 1823
页数:5
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