Transient Analysis of MLGNR Interconnects with Single Event (SE) Crosstalk Induced Effects Based on FDTD Model

被引:2
|
作者
Tan, Yiming [1 ]
Pan, Zhongliang [1 ]
机构
[1] South China Normal Univ, Sch Phys & Telecommun Engn, Guangzhou, Peoples R China
关键词
FDTD; intercalation doped TC-MLGNR; on-chip interconnects; single event crosstalk; PERFORMANCE;
D O I
10.1109/IAEAC54830.2022.9930037
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper investigates the single event crosstalk (SEC) effects for multilayer graphene nanoribbon (MLGNR) interconnects under various influencing factors, including temperature (200-600K), doping material, and the way of metal connection. A finite-difference time-domain (FDTD) model has been used to compare copper interconnects with MLGNR interconnects. And it has been discovered that lithium (Li) doped topcontact (TC) MLGNR interconnects are more resistant to SEC noise than copper or side-contact (SC) MLGNR interconnects. This paper also evaluates the output of interconnects that employ the current-mode signaling (CMS) or voltage-mode signaling (VMS) scheme under the influence of SEC. It is found that the CMS scheme has a greater advantage than the VMS scheme for resisting the SEC effects due to its smaller peak voltage and pulse width. The results of the SPICE simulation and those of the FDTD model proposed in this paper have shown to be very congruent.
引用
收藏
页码:1819 / 1823
页数:5
相关论文
共 50 条
  • [21] An Analytic Model for Predicting Single Event (SE) Crosstalk of Nanometer CMOS Circuits
    Baojun Liu
    Li Cai
    Xiaoqiang Liu
    Journal of Electronic Testing, 2020, 36 : 461 - 467
  • [22] Analysis of Crosstalk-Induced Effects in Multilayer Graphene Nanoribbon Interconnects
    Sahoo, Manodipan
    Rahaman, Hafizur
    JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, 2017, 26 (06)
  • [23] Model and analysis of single event transient sensitivity based on uncertainty quantification
    Liu, Baojun
    Cai, Li
    MICROPROCESSORS AND MICROSYSTEMS, 2022, 90
  • [24] Analysis of New Discrete-Rotary Crosstalk Model Based on FDTD
    Sun, Yaxiu
    Lin, Meng
    Lai, Yida
    Fang, Junpeng
    2017 INTERNATIONAL APPLIED COMPUTATIONAL ELECTROMAGNETICS SOCIETY SYMPOSIUM - ITALY (ACES), 2017,
  • [25] An accurate model for dynamic crosstalk analysis of CMOS gate driven on-chip interconnects using FDTD method
    Kumar, Vobulapuram Ramesh
    Kaushik, Brajesh Kumar
    Patnaik, Amalendu
    MICROELECTRONICS JOURNAL, 2014, 45 (04) : 441 - 448
  • [26] Modeling crosstalk effects of hybrid copper carbon nanotube interconnects using a novel accurate FDTD based method
    Nadir, Youssef
    Belahrach, Hassan
    Ghammaz, Abdelilah
    Naamane, Aze-eddine
    Radouani, Mohammed
    MICROELECTRONICS JOURNAL, 2022, 129
  • [27] Modeling crosstalk effects of hybrid copper carbon nanotube interconnects using a novel accurate FDTD based method
    Nadir, Youssef
    Belahrach, Hassan
    Ghammaz, Abdelilah
    Naamane, Aze-eddine
    Radouani, Mohammed
    Microelectronics Journal, 2022, 129
  • [28] An ABCD Parameter Based Modeling and Analysis of Crosstalk Induced Effects in Multilayer Graphene Nano Ribbon Interconnects
    Sahoo, Manodipan
    Rahaman, Hafizur
    2014 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2014, : 1138 - 1142
  • [29] An ABCD Parameter Based Modeling and Analysis of Crosstalk Induced Effects in Multiwalled Carbon Nanotube Bundle Interconnects
    Sahoo, Manodipan
    Ghosal, Prasun
    Rahaman, Hafizur
    2014 27TH INTERNATIONAL CONFERENCE ON VLSI DESIGN AND 2014 13TH INTERNATIONAL CONFERENCE ON EMBEDDED SYSTEMS (VLSID 2014), 2014, : 433 - 438
  • [30] An Analytical Model of the Propagation Induced Pulse Broadening (PIPB) Effects on Single Event Transient in Flash-Based FPGAs
    Sterpone, L.
    Battezzati, N.
    Kastensmidt, F. Lima
    Chipana, R.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 58 (05) : 2333 - 2340