Effects of Laser Parameters on the Characteristics of a Sn-3.5 wt.%Ag Solder Joint

被引:29
作者
Kim, Jeng-O [1 ]
Jung, Jae-Pil [2 ]
Lee, Jae-Hoon [1 ]
Jeong-Suh [1 ]
Kang, Hee-Shin [1 ]
机构
[1] Korea Inst Machinery & Mat, Laser & E Beam Applicat Team, Taejon 305343, South Korea
[2] Univ Seoul, Dept Mater Sci & Engn, Seoul 130743, South Korea
关键词
Nd:YAG laser; Sn-3.5wt.%Ag; lead free solder; reliability; laser soldering;
D O I
10.1007/s12540-009-0119-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Microstructure and shear strength were assessed for a Sn-3.5 wt.%Ag solder joint formed using a laser heat source. A continuous wave Nd:YAG laser was used to make the Sn-3.5 wt.%Ag solder joint. Solder balls of 400 pm diameter were used and the laser beam spot diameter at focus was approximately 120 pin. The UBM (Under BLIMP Metallurgy) on a FR4-PCB consisted of Cu/Ni/Au from bottom to top with a thickness of 15 mu m/5 mu m/0.05 mu m, respectively. In order to position solder balls on the UBM, RMA (rosin mildly activated) type flux for a BGA (Ball Grid array) was used. Selected optimal conditions were as follows: a laser power of 2W and heating time of 0.3 s, 0.5 s, and 0.7 s; a laser power of 3 W and heating time of 0.1 s and 03 s; and a laser power of 4 W and a heating time of 0.1 s. Under all conditions, the shear strengths of the solder joint of (CuNi)(3)Sn-4 at the interface between the pad and solder were larger than 554.37 gf (i.e. the shear strength obtained from hot plate reflow). When the laser power was set at 2 W, the microstructure of IMC (intermetallic compound) was recrystallized regularly due to active convection, which was caused by increased heating time. Under a laser power of 4 W and heating time of 0.7 s, the microstructure was recrystallized irregularly due to violent convection caused by excessive energy input (=laser power (W) xheating time (s)). The IMC layer increased in thickness as a result of increasing the energy input, and was affected by laser power more than by heating time.
引用
收藏
页码:119 / 123
页数:5
相关论文
共 15 条
[1]   Antimicrobial susceptibility and strain prevalence of Korean vaginal Lactobacillus spp. [J].
Choi, SY ;
Chang, CE ;
Kim, SC ;
So, JS .
ANAEROBE, 2003, 9 (06) :277-280
[2]   Activation energies of intermetallic growth of Sn-Ag eutectic solder on copper substrates [J].
Flanders, DR ;
Jacobs, EG ;
Pinizzotto, RF .
JOURNAL OF ELECTRONIC MATERIALS, 1997, 26 (07) :883-887
[3]  
Hartmann M., 1991, P LASERS MICROELECTR, P179
[4]   Formation and resettlement of (AuxNi1-x)Sn4 in solder joints of ball-grid-array packages with the Au/Ni surface finish [J].
Ho, CE ;
Zheng, R ;
Luo, GL ;
Lin, AH ;
Kao, CR .
JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (10) :1175-1181
[5]  
HONG SM, 2002, J KOREAN INST MET MA, V40, P1103
[6]  
James D., 1991, P LASERS MICROELECTR, P167
[7]  
LEE CB, 2002, J KWS, V20, P275
[8]   Characteristics of the Sn-Pb eutectic solder bump formed via fluxless laser reflow soldering [J].
Lee, JH ;
Park, D ;
Moon, JT ;
Lee, YH ;
Shin, DH ;
Kim, YS .
JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (10) :1153-1159
[9]  
LEE JS, 2002, J KWS, V20, P438
[10]   Inhibiting growth of the Au0.5Ni0.5Sn4 intermetallic layer in Pb-Sn solder joints reflowed on Au/Ni metallization [J].
Minor, AM ;
Morris, JW .
JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (10) :1170-1174