Effect of the tracing speed and span on roughness parameters determined by stylus type equipment

被引：19

作者：

Davinci, M. Arvinth ^{[1
]}

Parthasarathi, N. L. ^{[1
]}

Borah, Utpal ^{[1
]}

Albert, Shaju K. ^{[1
]}

机构：

[1] Indira Gandhi Ctr Atom Res, Met Forming & Tribol Programme, Kalpakkam 603102, Tamil Nadu, India

来源：

MEASUREMENT | 2014年 / 48卷

关键词：

Surface roughness; Surface profilometry; Design of Experiments; Analysis of variance; Scanning speed; Spacing; SURFACE-ROUGHNESS; AFM;

D O I：

10.1016/j.measurement.2013.11.023

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this work, the effect of the scanning speed and the spacing in a roughness measurement was studied on the reference specimen using "TALYSURF CLI 1000" Profilometer. Microfiltration with ratio of 2.5 lmand Gaussian filter 800 mu m was used. "TalyMap Platinum" software was used to analyse the data. Contact types of measurements were taken with inductive gauge using 2 mu m radius stylus. Design of Experiments (DOE) and Analysis of Variance (ANOVA) tools were employed in this study to conduct the experiments and validate the results. The profile parameters R-a, R-q and R-z and the Surface parameters S-a, S-q and S-z were selected as the response variables for the roughness. The study reveals that the scanning speed has the significant effect on only R-a, R-z and S-a and S-z measurements and the spacing has the significant effect on all the Profile and surface measurements. (C) 2013 Elsevier Ltd. All rights reserved.

引用

页码：368 / 377

页数：10

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