First test beam results on DEPFET pixels for the ILC

被引:5
作者
Kohrs, R.
Reuen, L.
Andricek, L.
Fischer, P.
Giesen, F.
Krueger, H.
Lutz, G.
Mathes, M.
Moser, H. G.
Peric, I.
Richter, R. H.
Sandow, C.
Treis, J.
Trimpl, M.
von Toerne, E.
Velthuis, J. J.
Wermes, N.
机构
[1] Univ Bonn, Inst Phys, D-53115 Bonn, Germany
[2] Max Planck Inst Halbleiterlabor, D-81739 Munich, Germany
[3] Univ Mannheim, D-68131 Mannheim, Germany
关键词
DEPFET; International linear collider (ILC); vertex detector; active pixel sensor; beam test; tracking;
D O I
10.1016/j.nima.2006.05.073
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
By incorporating a field effect transistor into a fully depleted sensor substrate the DEPFET sensor combines radiation detection and amplification in each pixel, resulting in very low noise and high spatial resolution. This makes DEPFET sensors a favorable technology for the vertex detector at the planned International Linear Collider (ILC). A prototype system with fast steering chips, a current-based readout chip and a 64 x 128 pixels DEPTET matrix has been built and was operated successfully in the DESY test beam. First results of the studies on two different DEPFET design options are presented in this paper. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:172 / 177
页数:6
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