Rapid and robust two-dimensional phase unwrapping via deep learning

被引:140
作者
Zhang, Teng [1 ]
Jiang, Shaowei [2 ]
Zhao, Zixin [3 ]
Dixit, Krishna [2 ]
Zhou, Xiaofei [1 ]
Hou, Wa [1 ]
Zhang, Yongbing [4 ]
Yan, Chenggang [1 ]
机构
[1] Hangzhou Dianzi Univ, Sch Automat, Hangzhou 310018, Zhejiang, Peoples R China
[2] Univ Connecticut, Dept Biomed Engn, Storrs, CT 06269 USA
[3] Xi An Jiao Tong Univ, Sch Mech Engn, Xian 710049, Shaanxi, Peoples R China
[4] Tsinghua Univ, Grad Sch Shenzhen, Shenzhen 518055, Peoples R China
基金
中国国家自然科学基金;
关键词
ALGORITHM;
D O I
10.1364/OE.27.023173
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Two-dimensional phase unwrapping algorithms are widely used in optical metrology and measurements. The high noise from interference measurements, however, often leads to the failure of conventional phase unwrapping algorithms. In this paper, we propose a deep convolutional neural network (DCNN) based method to perform rapid and robust two-dimensional phase unwrapping. In our approach, we employ a DCNN architecture, DeepLabV3+, with noise suppression and strong feature representation capabilities. The employed DCNN is first used to perform semantic segmentation to obtain the segmentation result of the wrapped phase map. We then combine the wrapped phase map with the segmentation result to generate the unwrapped phase. We benchmarked our results by comparing them with well-established methods. The reported approach out-performed the conventional path-dependent and path-independent algorithms. We also tested the robustness of the reported approach using interference measurements from optical metrology setups. Our results, again, clearly out-performed the conventional phase unwrap algorithms. The reported approach may find applications in optical metrology and microscopy imaging. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:23173 / 23185
页数:13
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