Silicon nanowire pinch-off FET : Basic operation and analytical model

被引:15
作者
Soree, Bart [1 ]
Magnus, Wim [1 ]
机构
[1] IMEC, B-3001 Louvain, Belgium
来源
ULIS 2009: 10TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION OF SILICON | 2009年
关键词
D O I
10.1109/ULIS.2009.4897582
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An analytical model has been constructed for a silicon nanowire pinch-off FET. This is a uniformly doped nanowire with surrounding oxide and gate. For large radii nanowires, in the long channel approximation, we obtain an analytical expression for the depletion length in the radial direction. Making use of the gradual channel approximation, we are able to investigate the current both above and below threshold. The results obtained from the analytical model are compared with the self-consistent numerical solutions of a self-consistent Poisson solver. We show that the subthreshold slope is 60 mV/dec and good I(ON)/I(OFF) ratios and I(ON) values are obtained for this device.
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页码:245 / 248
页数:4
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