Infrared Face Recognition Based on LBP Histogram and KW Feature Selection

被引:1
作者
Xie, Zhihua [1 ]
机构
[1] Jiangxi Sci & Technol Normal Univ, Key Lab Opt Elect & Commun, Nanchang 330013, Jiangxi, Peoples R China
来源
INTERNATIONAL SYMPOSIUM ON PHOTONICS AND OPTOELECTRONICS 2014 | 2014年 / 9233卷
关键词
infrared face recognition; feature selection; KW test; LBP Histogram; LOCAL BINARY PATTERNS; KRUSKAL-WALLIS;
D O I
10.1117/12.2068131
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The conventional LBP-based feature as represented by the local binary pattern (LBP) histogram still has room for performance improvements. This paper focuses on the dimension reduction of LBP micro-patterns and proposes an improved infrared face recognition method based on LBP histogram representation. To extract the local robust features in infrared face images, LBP is chosen to get the composition of micro-patterns of sub-blocks. Based on statistical test theory, Kruskal-Wallis (KW) feature selection method is proposed to get the LBP patterns which are suitable for infrared face recognition. The experimental results show combination of LBP and KW features selection improves the performance of infrared face recognition, the proposed method outperforms the traditional methods based on LBP histogram, discrete cosine transform(DCT) or principal component analysis(PCA).
引用
收藏
页数:6
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