Measurement of the Intrinsic Parameters of Single-Mode VCSELs

被引：52

作者：

Perez, P. ^{[1
,2
]}

Valle, A. ^{[1
]}

Noriega, I. ^{[1
]}

Pesquera, L. ^{[1
]}

机构：

[1] Univ Cantabria, CSIC, Inst Fis Cantabria, E-39005 Santander, Spain

[2] Univ Cantabria, Fac Ciencias, Dept Fis Moderna, E-39005 Santander, Spain

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 2014年 / 32卷 / 08期

关键词：

Amplitude noise spectrum; intrinsic parameters; linewidth enhancement factor; semiconductor lasers; spontaneous emission; vertical-cavity surface-emitting lasers (VCSELs); SURFACE-EMITTING LASERS; WORKING PARAMETERS; EXTRACTION; SIMULATION;

D O I：

10.1109/JLT.2014.2308303

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A complete characterization of the working parameters of a long-wavelength vertical-cavity surface-emitting laser (VCSEL) is presented. A technique is described for extracting values for the parameters of semiconductor laser rate equations based on simple expressions for the laser power and linewidth as a function of the bias current. The differential carrier lifetime at threshold is estimated by using the linear relation between the laser linewidth and the bias current that is obtained for below threshold operation. High resolution CW optical spectrum measurements are performed to apply this technique for extraction of the parameters of a 1550-nm single-transverse mode VCSEL. Intensity noise spectrum analysis is used to complete our parameter extraction procedure and to compare with parameter values obtained from laser linewidth measurements.

引用

页码：1601 / 1607

页数：7

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