Effects of Humidity and Sample Surface Free Energy on AFM Probe-Sample Interactions and Lateral Force Microscopy Image Contrast

被引:38
|
作者
Chen, Lijiang [1 ]
Gu, Xiaohong [1 ]
Fasolka, Michael J. [1 ]
Martin, Jonathan W. [1 ]
Nguyen, Tinh [1 ]
机构
[1] NIST, Gaithersburg, MD 20899 USA
关键词
SELF-ASSEMBLED MONOLAYERS; RELATIVE-HUMIDITY; FRICTION FORCE; CAPILLARY CONDENSATION; ADHESION FORCES; TAPPING MODE; THIN-FILMS; WATER; SPECTROSCOPY; POLYMER;
D O I
10.1021/la8037928
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Contrast between hydrophilic and hydrophobic domains and probe-sample adhesion forces as a function of relative humidity (RH) and sample surface free energy have been investigated using hydrophilic and hydrophobic atomic force microscopy (AFM) probes. For hydrophobic probes, the adhesion force is low, and the AFM image contrast between hydrophilic and hydrophobic domains is poor over the 0-93% RH. For hydrophilic probes, the image contrast between the hydrophilic and hydrophobic domains is poor at low RH but improved at high RH. This image contrast change is related to adhesion force differences between the two domains. In turn, the enhanced adhesion and image contrasts at elevated RH are attributed to capillary forces, which are large over the hydrophilic domains but greatly diminished over the hydrophobic domains. The adhesion force increases slightly with sample surface free energy at low RH, but increases rapidly with increasing sample surface free energy at high RH. The results indicate that for AFM in air, tailoring the RH of the probe-sample environment and utilizing a hydrophilic probe can enhance imaging of materials chemical heterogeneity with nanoscale spatial resolution.
引用
收藏
页码:3494 / 3503
页数:10
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共 32 条
  • [1] The effect of humidity on probe-sample interactions in near-field scanning optical microscopy
    Wei, PK
    Fann, WS
    JOURNAL OF APPLIED PHYSICS, 2000, 87 (05) : 2561 - 2564
  • [2] The effect of humidity on probe-sample interactions in near-field scanning optical microscopy
    Wei, P.K.
    Fann, W.S.
    1600, American Institute of Physics Inc. (87):
  • [3] Experimental evaluation of probe-sample force in tapping mode scanning force microscopy
    Matlis, S
    Edgar, R
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  • [4] A novel probe-sample separation estimation scheme for atomic force microscopy
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    Mironov, V.L.
    Panfilov, A.I.
    Petrukhin, A.A.
    Revin, D.G.
    Rogov, V.V.
    Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya, 2001, (02): : 98 - 102
  • [7] PROBE-SAMPLE INTERACTIONS IN REFLECTION NEAR-FIELD SCANNING OPTICAL MICROSCOPY
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