Supersonic molecular beam studies of the dissociative chemisorption of GeH4 and Ge2H6 on the Ge(100) and Ge(111) surfaces

被引:21
作者
Jones, ME
Roadman, SE
Lam, AM
Eres, G
Engstrom, JR
机构
[1] CORNELL UNIV,SCH CHEM ENGN,ITHACA,NY 14853
[2] OAK RIDGE NATL LAB,DIV SOLID STATE,OAK RIDGE,TN 37831
关键词
D O I
10.1063/1.472516
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
zThe reaction probabilities of GeH4 and Ge2H6 on the Ge(100) and Ge(111) surfaces have been measured as a function of substrate temperature, incident kinetic energy, and angle of incidence employing supersonic molecular beam scattering techniques. At sufficiently large incident kinetic energies (E(i)> 1 eV) both GeH4 and Ge2H6 react by direct dissociative chemisorption on both surfaces examined, with the reaction probability increasing approximately exponentially with increasing (scaled) incident kinetic energy. At moderate kinetic energies (E(i) similar to 0.4 eV), however, Ge2H6 reacts by a precursor-mediated mechanism on Ge(100), as demonstrated by a decrease in the reaction probability with either increasing substrate temperature or incident kinetic energy, Interestingly, under similar conditions, no evidence is found for precursor-mediated adsorption of Ge2H6 on the Ge(111) surface. The reaction of Ge2H6 does not exhibit a GeH4 production channel on either Ge(100) or Ge(111) for the conditions examined here. The results obtained at high incident kinetic energies (>1 eV) are well described by a statistical model based upon a Rice-Ramsperger-Kassel-Marcus (RRKM) framework. The moderate incident kinetic energy results for Ge2H6 on Ge(100) are well described by a model that assumes reaction via a trapping, precursor-mediated mechanism. (C) 1996 American Institute of Physics.
引用
收藏
页码:7140 / 7151
页数:12
相关论文
共 36 条
[1]  
[Anonymous], 1991, DYNAMICS GAS SURFACE
[2]   GE(001) GAS-SOURCE MOLECULAR-BEAM EPITAXY ON GE(001)2X1 AND SI(001)2X1 FROM GE2H6 - GROWTH-KINETICS AND SURFACE ROUGHENING [J].
BRAMBLETT, TR ;
LU, Q ;
LEE, NE ;
TAYLOR, N ;
HASAN, MA ;
GREENE, JE .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (04) :1504-1513
[3]  
CROWELL JE, 1991, MATER RES SOC SYMP P, V204, P253
[4]   SURFACE PI-BONDING AND THE NEAR-1ST-ORDER DESORPTION-KINETICS OF HYDROGEN FROM GE(100)2X1 [J].
DEVELYN, MP ;
COHEN, SM ;
ROUCHOUZE, E ;
YANG, YL .
JOURNAL OF CHEMICAL PHYSICS, 1993, 98 (04) :3560-3563
[5]   DISSOCIATIVE ADSORPTION OF SI2H6 ON SILICON AT HYPERTHERMAL ENERGIES - THE INFLUENCE OF SURFACE-STRUCTURE [J].
ENGSTROM, JR ;
XIA, LQ ;
FURJANIC, MJ ;
HANSEN, DA .
APPLIED PHYSICS LETTERS, 1993, 63 (13) :1821-1823
[6]   DYNAMICS OF THE DISSOCIATIVE ADSORPTION OF DISILANE ON SI(100) - ENERGY SCALING AND THE EFFECT OF CORRUGATION [J].
ENGSTROM, JR ;
HANSEN, DA ;
FURJANIC, MJ ;
XIA, LQ .
JOURNAL OF CHEMICAL PHYSICS, 1993, 99 (05) :4051-4054
[7]   HETEROEPITAXIAL GROWTH OF GE FILMS ON (100) GAAS BY PYROLYSIS OF DIGERMANE [J].
ERES, D ;
LOWNDES, DH ;
TISCHLER, JZ ;
SHARP, JW ;
GEOHEGAN, DB ;
PENNYCOOK, SJ .
APPLIED PHYSICS LETTERS, 1989, 55 (09) :858-860
[8]   THE ROLE OF HYDRIDE COVERAGE IN SURFACE-LIMITED THIN-FILM GROWTH OF EPITAXIAL SILICON AND GERMANIUM [J].
ERES, G ;
SHARP, JW .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (12) :7241-7250
[9]   INVESTIGATION OF THE KINETICS OF DIGERMANE CHEMISORPTION AND REACTION-PRODUCT DESORPTION IN THIN-FILM GROWTH OF GERMANIUM [J].
ERES, G ;
SHARP, JW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1993, 11 (05) :2463-2471
[10]   SURFACE-DIFFUSION AND PHASE-TRANSITION ON THE GE(111) SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY [J].
FEENSTRA, RM ;
SLAVIN, AJ ;
HELD, GA ;
LUTZ, MA .
PHYSICAL REVIEW LETTERS, 1991, 66 (25) :3257-3260