New scratch tester developed for plasma polymer characterization

被引：0

作者：

Prikryl, R ^{[1
]}

Salyk, O ^{[1
]}

Kripal, L ^{[1
]}

Cech, V ^{[1
]}

机构：

[1] Brno Univ Technol, Inst Mat Chem, CZ-61200 Brno, Czech Republic

来源：

CZECHOSLOVAK JOURNAL OF PHYSICS | 2002年 / 52卷

关键词：

adhesion; scratch; thin film; plasma polymer;

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A fully PC-controlled scratch tester was developed for testing of adhesion between the film and the substrate. The Rockwell ball or the diamond tip is driven over the film surface to produce a scratch in this film. The load on the ball (tip) is linearly increased and the value of the load, at which adhesion failure is detected, is known as the critical load between the film and the substrate. The apparatus was constructed and optimized for polymer films with respect to the force range and sensitivity. The plot of normal and lateral force is recorded and analyzed in order to obtain the critical load value. The optical polarizing and the atomic force microscopy enabled to analyze the scratch path.

引用

页码：824 / 828

页数：5