Determination of tip-sample interaction potentials by dynamic force spectroscopy

被引：104

作者：

Hölscher, H

Allers, W

Schwarz, UD

Schwarz, A

Wiesendanger, R

机构：

[1] Univ Hamburg, Inst Phys Appl, D-20355 Hamburg, Germany

[2] Univ Hamburg, Microstruct Res Ctr, D-20355 Hamburg, Germany

来源：

PHYSICAL REVIEW LETTERS | 1999年 / 83卷 / 23期

关键词：

D O I：

10.1103/PhysRevLett.83.4780

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We introduce a new method which allows the precise determination of the lip-sample interaction potentials with an atomic force microscope and avoids the so-called "jump to contact" of the tip to the sample surface. The method is based on the measurement of the resonance frequency as a function of the resonance amplitude of the oscillated cantilever. The application of this method to model potentials and to experimental data, obtained for a graphite sample and a silicon lip in ultrahigh vacuum, demonstrates its reliability.

引用

收藏

页码：4780 / 4783

页数：4

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