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Cross-linked Polymer-Blend Gate Dielectrics through Thermal Click Chemistry
被引:7
作者:
Li, Shengxia
[1
]
Tang, Wei
[2
]
Zhang, Weimin
[3
]
Guo, Xiaojun
[2
]
Zhang, Qing
[1
]
机构:
[1] Shanghai Jiao Tong Univ, Sch Chem & Chem Engn, Shanghai Key Lab Polymer & Elect Insulat, Dept Polymer Sci & Engn, Shanghai 200240, Peoples R China
[2] Shanghai Jiao Tong Univ, Dept Elect Engn, Natl Engn Lab TFT LCD Mat & Technol, Shanghai 200240, Peoples R China
[3] Guangxi Univ Nationalities, Coll Chem & Chem Engn, Nanning 530006, Peoples R China
基金:
国家教育部博士点专项基金资助;
中国国家自然科学基金;
关键词:
cross-linking agents;
click chemistry;
device fabrication;
dielectrics;
polymer blends;
FIELD-EFFECT TRANSISTORS;
THIN-FILM TRANSISTORS;
HIGH-K POLYMER;
ORGANIC TRANSISTORS;
CHARGE-TRANSPORT;
HIGHLY EFFICIENT;
HIGH-PERFORMANCE;
SEMICONDUCTORS;
ELECTRONICS;
CHANNEL;
D O I:
10.1002/chem.201502825
中图分类号:
O6 [化学];
学科分类号:
0703 ;
摘要:
New cross-linking reagents were synthesized and mixed with polystyrene (PS) in solution to form a blend. Thin-films were spin-coated from the blend and then crosslinked by thermal activation at relatively low temperature (100 degrees C) to form cross-linked gate dielectrics. This new method is compatible with plastic substrates in flexible electronics. The azide and alkyne cross-linking reagents are kinetically stable at room temperature, so any premature cross-linking is avoided during processing. This method also significantly improved the dielectric performances of PS thin films. Solution-processed top-gate organic field-effect transistor devices with indacenodithiophene-benzothiadiazole copolymer as semiconductor layer and the cross-linked PS blend as dielectric layer showed improved performances with lower gate leakages and higher operation stabilities than devices with neat PS film as dielectric layer.
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页码:17762 / 17768
页数:7
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